Piezoelectric coupling can modify conductivity in nanoscale devices to introduce a new paradigm in computing technology where electromechanical coupling replaces charge transport. A major hurdle in the development of this technology is the lack of metrology capable of non-destructive measurement of nanoscale strain. The aim of this post is to develop links between traceable meso-scale metrology and crystallographic strain via in-situ interferometry and synchrotron x-ray diffraction. The instrumentation will be developed at the XMaS CRG beamline at the European Synchrotron Radiation Facility in Grenoble, France (www.xmas.ac.uk). The post is part of the European Metrology Research Programme‘s Nanostrain Project, led by the National Physical Laboratory.
You will have a PhD in a relevant subject area and experience in x-ray diffraction. The post is available until 28 Feburary 2016.
Job Ref: R-585217 Closing Date: 16 February 2014