Piezoelectric coupling can modify conductivity in nanoscale devices to introduce a new paradigm in computing technology where electromechanical coupling replaces charge transport. A major hurdle in the development of this technology is the lack of metrology capable of non-destructive measurement of nanoscale strain. The aim of this post is to develop links between traceable meso-scale metrology and crystallographic strain via in-situ interferometry and synchrotron x-ray diffraction. The instrumentation will be developed at the XMaS CRG beamline at the European Synchrotron Radiation Facility in Grenoble, France ( The post is part of the European Metrology Research Programme‘s Nanostrain Project, led by the National Physical Laboratory.

You will have a PhD in a relevant subject area and experience in x-ray diffraction. The post is available until 28 Feburary 2016.

Job Ref: R-585217 Closing Date: 16 February 2014

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