events

TXRF Conference 2011 program online

Friday, May 27th, 2011

The program of this year’s TXRF Conference is now online available. The 14th TXRF conference takes place in Dortmund, Germany June 6-9, 2011. Further informations are to be found at the conference website http://www.txrf2011.org.

Theoretical and Practical XRF workshop: Instrumentation and Applications (THEOPRACT-2011)

Sunday, May 22nd, 2011

The workshop taking place June 28-30, 2011 in Girona, Spain covers the theory and applications of the various XRF spectrometric techniques, from the well established to the emerging topics.

The program consists of several lectures, given by international and national recognized speakers and practical sessions, which include hands on activities using different x-ray fluorescence based configurations: TXRF , EDXRF and µ-EDXRF.

Attendees have the opportunity to bring up questions on specific topics or applications for discussion in the workshop.

Topics of discussion:

  • Sample preparation procedures for XRF analysis
  • Quantification methodology
  • State-of-the-Art of commercial and lab-made XRF instrumentation (WDXRF, EDXRF, TXRF, µ-XRF)
  • XRF spectrometry applications (Theoretical and practical sessions)
  • Further information can be found on the workshop homepage.

    EXRS 2010 conference proceedings published

    Tuesday, February 15th, 2011

    X-Ray Spectrometry edited a special Issue with contributions of the 14th European Conference on X-Ray Spectrometry taking place June 20–25, 2010 in Figueira da Foz, Coimbra, Portugal.

    DOI: 10.1002/xrs.1296

     

    First Announcement Technart 2011 – Berlin, April 26 – 29 2011

    Thursday, November 25th, 2010

    Dear friends and colleagues,

    We are pleased to announce that TECHNART 2011 (Non-destructive and Microanalytical Techniques in Art and Cultural Heritage Research) will take place in the BAM Federal Institute for Materials Research and Testing, Berlin, Germany from 26 to 29 April 2011.

    The conference follows the successful organization of TECHNART 2007 in Lisbon, in April 2007 by Prof. Maria Luísa de Carvalho and in April 2009 in Athens organized by the Institute of Nuclear Physics at NCSR “Demokritos”, Athens and the Institute of Electronic Structure and Lasers at FORTH, Heraklion, Crete (IESL-FORTH).

    The aim of TECHNART 2011 is to provide a scientific forum to present and promote the use of analytical spectroscopy techniques on the field of Cultural Heritage. The conference offers an outstanding and unique opportunity for exchanging knowledge on leading edge developments. Cultural Heritage studies are interpreted in a broad sense, including pigments, stones, metals, glass, ceramics, chemometrics on artwork studies, resins, fibers, forensic applications in art and archaeology, conservation etc.

    TECHNART 2011 is organized by the BAM Federal Institute for Materials Research and Testing, Berlin in collaboration with the Technische Universität Berlin and the Helmholtz-Zentrum Berlin für Materialien und Energie GmbH.

    You can find detailed information on the website: http://www.technart2011.bam.de

    Please notice the deadline for paper submission is January 14, 2011.

    We would appreciate it if you could circulate this announcement as widely as possible, and encourage your colleagues to attend.

    For further questions please contact our organization office Mrs. Karin Pachaly and Ms. Ines Schülke (E-mail: technart2011@bam.de phone: +49 30 8104-3055).

    Yours sincerely,

    Dr. Oliver Hahn, Prof. Dr. Birgit Kanngießer, Dr. Andrea Denker, Karin Pachaly, Ines Schülke

    Workshop ‘Analytical Trends and Needs for Nanotechnology’

    Tuesday, September 21st, 2010

    The workshop in Berlin, Germany on November 8, 2010 is jointly organized by Physikalisch-Technische Bundesanstalt (PTB), Fraunhofer Institute for Integrated Systems and device technology on behalf of the EU projects Analytical Network for Nanotech (ANNA) and Semiconductor Equipment Assessment Leveraging Innovation (SEAL).
    Its scope is

    • to show and discuss state-of-the-art analysis for nanotechnologies,
    • to show latest trends, needs and developments for characterization for nanoelectronics, photovoltaics, environmetal control and engineered nanoparticles.
    • to enable an interdisciplinary discussion and knowledge exchange of researchers working in the field of characterization of materials for nanotechnologies
    • to link researchers from metrology and production facilities

    Further information can be found at the workshop homepage.

    EXRS 2010 abstract submission deadline: April 17

    Saturday, April 3rd, 2010

    In two weeks the abstract submission for the European Conference on X-Ray Spectrometry closes. For further information see EXRS 2010 homepage.

    EXSA supports EXRS 2010

    EXRS 2010 – Second Announcement published

    Thursday, February 25th, 2010

    In 2010, the European Conference on X-Ray Spectrometry (EXRS 2010) will be held on June 20-25, in the Portuguese “Silver Coast” beach resort Figueira da Foz, near the historical city Coimbra that hosts one of the oldest universities of Europe.

    We invite you to visit the conference website for more details and also the brand new information that is now available.

    We have already over 100 Registrations & Pre-registrations and 13 important Industrial Exhibitors.

    * Please see in “lodging”, on the right side of the conference website, the very fair hotel prices that are being offerred for the occasion, including a more luxuary brand new one; for every hotel, the conference site has a link to the hotel website, with elucidative photos. As an alternative, you may also make a simulation (for the dates and conditions you wish) for all the hotels on the website http://www.bookingchannels.com/en/City/Figueira_da_Foz.htm

    * In “Social Events” you can see details on the Conference Dinner. It takes place in the “Grand Casino of Figueira da Foz” , in the main room, the “Salão Caffé”, which has unique frescos painted on the ceiling. The menu is detailed in the conference website.

    * For the conference Excursion you may choose for the visit to Coimbra and its 700-year old University or the visit to the Fatima Sanctuary and Monastery of Batalha, which is considered UNESCO World Heritage.

    * IMPORTANT DATES
    Abstract submission: 10 April 2010
    Abstract acceptance: 15 April 2010
    Early registration: 1 May 2010

    Submission of Manuscript (for publication in special issue of the Journal “X-Ray Spectrometry (Wiley Interscience)”): 30 June 2010

    * You can download the Conference poster, placed in the upper right corner of the conference website.

    Wishing to welcome you in Figueira da Foz, Portugal!
    The Organizing Committee

    EXRS 2010 webpage launched

    Thursday, July 9th, 2009

    The webpage of next year’s EXRS conference in Figueira da Foz, Portugal has been launched. The conference will take place at the coast of the atlantic ocean June 20-25, 2010. Further information can be found soon at http://exrs2010.fis.uc.pt/.

    PRORA 2009 announced

    Wednesday, July 8th, 2009

    The next conference on process-oriented X-ray analytics in Berlin will take place November 26/27, 2009. (The conference language is German.) The application of X-ray analytics in the photovoltaics industry will be a main focus of this year’s conference. Further information can be found at the first announcement flyer.

    second announcement of TXRF 2009

    Wednesday, February 11th, 2009

    The second announcement of the 13th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2009) in Gothenburg, Sweden has been published.

    The deadline for abstract submission is extended until March 16, 2009.

    EXSA supports TXRF 2009

    EXSA supports TXRF 2009