The next conference on process-oriented X-ray analytics in Berlin will take place November 26/27, 2009. (The conference language is German.) The application of X-ray analytics in the photovoltaics industry will be a main focus of this year’s conference. Further information can be found at the first announcement flyer.

This entry was posted on Wednesday, July 8th, 2009 at 7:34 pm and is filed under events.