A Researcher Excellence Grant (REG) is to be assigned.

The work of the REG-Researcher is to undertake, complement and enforce the work of the Joint Research Project (JRP) by innovating well characterised materials systems relevant to the semiconductor industry. Using these systems the REG-Applicant will analyse nanolayers and buried interfacial characterisation, thin film composition and determine the very steep impurity distributions in “classical” inorganic based semiconductor systems as well as the emerging organic based devices. The REG-Researcher will develop metrology for non-destructive characterisation using x-ray synchrotron based methods and ultra-high depth resolution methods using secondary ion mass spectrometry (SIMS) as well as complementary methods. More specifically the REG-Researcher will be involved in:

1. Improvement of non-destructive methods for the characterisation of nanolayers and buried interfaces, i.e. chemical depth-profiling of nanolayers with trace level sensitivity and high information at depths up to 200 nm, with respect to three types of methodologies (composition of nanolayers, depth profiling and chemical speciation).
2. The development of essential metrology to enable 3D nanoscale chemical imaging of organic electronic materials using new massive argon cluster sputtering combined with secondary ion mass spectrometry (SIMS) for analysis.
3. The exploration and development of essential metrology for ultra-high resolution depth profiling of inorganic electronic system using oxygen cluster beam sputtering combined with secondary ion mass spectrometry. The REG-Researcher is required to perform high class scientific research, emphasised by the publication of peer reviewed scientific papers and contributions to international conferences.

EXPERIENCE REQUIREMENTS: The REG-Researcher must have a Ph.D degree in physics, chemistry or engineering with (preferentially) experience in TOF SIMS, Synchrotron X-ray analysis or SPM.

DURATION: 30 months
further information

APPLICATION DEADLINE: May 3, 2012 (online subm. until midnight)

CONTACT: Prof. W.Vandervorst, vdvorst@imec.be, +32 016 281 286

see also NEW TECHNOLOGIES ADVERTS

Imec performs world-leading research in nano-electronics.
We leverage our scientific knowledge with the innovative power of our global partnerships in ICT, healthcare and energy. In a unique high-tech environment, our international top talent is committed to providing the building blocks for a better life in a sustainable society. Our goal: creating innovative solutions that are relevant for the industry.

Two subsequent Researcher Excellence Grants (REG) are to be assigned.

1. The REG-Researcher is required to develop and validate measurement protocols, fitting algorithms and modelling strategies for the evaluation of X-Ray Spectrometry (XRS: GI-XRF, XRR, NEXAFS) techniques for the non-destructive characterisation of nanolayers and buried interfaces. The REG-applicant will investigate the performances and limitations of chemical depth-profiling of nanolayers based on both XRS techniques and Angle-resolved XPS technique. This work complements JRP-NEW01 TReND, which includes the management of state-of-the art samples along with the development of GI-XRS-based chemical depth profiling of nanolayers with trace level sensitivity and high information at depths up to 200 nm.

EXPERIENCE REQUIREMENTS: The REG-Researcher must have relevant research experience in X-ray spectrometry and material Science. Experience with synchrotron-based experiments along with experience with programming for the mathematical modelling of experimental data would be advantageous.

DURATION: 12 months
further information

2. The REG-Researcher is required to develop measurement protocols and modelling strategies for the evaluation of Grazing-incidence X-Ray Spectrometry (GI-XRS) techniques for the non-destructive characterisation of nanolayers and buried interfaces. This work is described in JRP NEW01 TReND, which details the management of state-of-the art samples along with the development of GI-XRS-based chemical depth-profiling of nanolayers with trace level sensitivity and high information at depths up to 200 nm.

EXPERIENCE REQUIREMENTS: The REG-Researcher must have relevant research experience in X-ray spectrometry and materials science. Experience with programming for mathematical modelling of experimental data would be advantageous.

DURATION: 18 months
further information

APPLICATION DEADLINE: May 3, 2012 (online subm. until midnight)

CONTACT: Narciso Gambacorti, narciso.gambacorti@cea.fr, +33 (0)4 38 78 05 18

see also NEW TECHNOLOGIES ADVERTS

CEA-LETI in Grenoble is one of the major European research centers for applied electronics with a staff of 1,600 people. More than 85% of its activity is dedicated to research finalized with external partners. CEA-LETI has sparked the creation of nearly thirty high technology start-ups, including Soitec, world leader in silicon on insulator. Leti files some 180 patents a year and manage a portfolio of 1,000 inventions protected by patents. The nanocharacterization platform is composed of several competence centres of physical and chemical characterization techniques including ion beam analysis, x-ray analysis, electron microscopy, scanning probe microscopy, surface analysis and optical characterization techniques together with the mandatory sample preparation. The synergy between all these complementary characterization techniques, the proximity with the ESRF and with the ILL are the key factors that allows the nanocharacterization platform to provide “state-of-the-art” characterization support.

At the Laboratoire de Chimie Physique – Matière et Rayonnement
(LCP-MR, Université Paris 6 and CNRS, UMR 7614) a position for a
POST DOCTORAL RESEARCH ASSISTANT
in the research area of
Resonant x-ray inelastic scattering (RIXS) on gas-phase species
is advertized.
The full-time position is immediately available for a period of 12 months.
For further information see this pdf-file.

Tasks:

• Development of quantitative models for the scattering of EUV and X-ray radiation on structured surfaces, including stochastic parameters of real samples such as surface and edge roughness as well as conception, carrying-out and evaluation of the associated experiments
• Conception, carrying-out and evaluation of experiments for small-angle X-ray scattering (SAXS) on biological nanoparticles and on nanoparticles in biological media

Requirements:

• Completed university studies of physics with a very good grade (German “Diplom” or master)
• Knowledge and practical experience in at least one of the following fields: synchrotron radiation, small-angle X-ray scattering, optical scattering procedures mathematic modelling of scattering processes, preparation and investigation of biological samples with physical methods
• Interest in the development of theoretical models by software solutions by your own and in the carrying-out and interpretation of complex experiments
• Pronounced ability to work in a team, good programming knowledge
• Good command of both the German and the English languages.

Application deadline:  March 15, 2012

For further information see www.ptb.de

• Product Manager XRF (Panalytical)
• Area Business Manager Russia X-ray Diffraction/ Fluorescence (Panalytical)
• Area Business Manager Middle-East X-Ray Diffraction / Fluorescence (Panalytical)
• Wissenschaftlichen Mitarbeiter (m/w) im Bereich Emissions- und Massenspektrometrie (Spectro)
• Field Service Engineer XRF (f/m) for East China (Spectro)
• Scientist (m/f) as Product Manager Elemental Analysis to further strengthen the global X-ray fluorescence marketing team (Bruker AXS)
• Application Specialist “X-ray fluorescence” (m/f) in Beijing, China (Bruker AXS)

For further job offers please check the career pages of our institutional members:

• PANalytical B.V.
• KETEK GmbH
• Bruker AXS
• SPECTRO Analytical Instruments GmbH
• Amptek Inc.

The Physikalisch-Technische Bundesanstalt (PTB) is the National Metrology Institute of the Federal Republic of Germany with scientific and technical service tasks. It furthers progress and reliability in metrology for society, economy and science.

PTB uses synchrotron radiation of the electron storage rings Metrology Light Source (MLS) and BESSY II in Berlin-Adlershof for metrological purposes. Within the scope of national and international research projects, the Departments 7.1 “X-ray Metrology with Synchrotron Radiation” and 7.2 “Radiometry with Synchrotron Radiation” are looking for

three physicists with a German “Diplom” or a Master graduation

to join them as soon as possible. The posts are limited in time; you may have the opportunity to obtain a doctor’s degree (PhD). The tasks are in compliance with the characteristics of Group IIa of the BAT remuneration scheme; the remuneration will be paid according to the regulations of the TVöD (85 % for PhD candidates).

Tasks:
(1) Development and application of quantitative methods of grazing-incidence
small-angle X-ray scattering (GISAXS) for the investigation of nanostructures
and nanoparticles on surfaces

(2) Study of the interaction between X-ray lasers and matter via ion- and
fluorescence spectroscopy on gases, and further development of
radiometric methods for the characterisation of femtosecond lasers
in the X-ray range

(3) Development and application of IR microspectrometry at a newly
created measuring facility of MLS for the characterisation of layer-
and other systems

Requirements:

* Completed university studies of physics with a very good grade (German “Diplom” or Master)
* Knowledge and practical experience in at least one of the following fields: X-ray scattering, X-ray spectroscopy, IR spectrometry, synchrotron radiation, free-electron laser, surface analysis, atomic and molecular spectroscopy
* Interest in the realisation and interpretation of complex experiments
* A particular ability to work in a team, and a good command of English

For further information, please contact
(1) Dr M. Krumrey, +49 (0)30 6392 5085 or
(2) Prof. Dr M. Richter, +49 (0)30 6392-5084 or
(3) Dr G. Ulm, +49 (0)30 3481 7312.

The PTB promotes the professional equality of women and men and is thus especially interested in applications from women.

Disabled persons will be given priority if they have the same occupational aptitude.

Within the scope of the official feasibilities, PTB offers flexible part-time work schemes in order to support in particular the compatibility of family and profession.

Are you interested? Then we are looking forward to hearing from you. Please send your detailed application by 18 February 2010 to the address below, quoting the reference number 05/10-7.

Physikalisch-Technische Bundesanstalt
– Institut Berlin –
Abbestr. 2-12
10587 Berlin
Germany

The university of Antwerp is seeking to fill the following full time vacancy (m/f) at the Department of Chemistry of the Faculty Science: Tenured Academic Staff Environmental Chemistry and Environmental Chemical Analysis
The assignment consists of lecturing duties, scientific research and service to society. During the first period of (maximum) ten years, scientific research will be the main activity. Your research is expected to be in the field of Environmental Chemistry. Within a few years you will be leading the research group Environmental Analysis of the University of Antwerp as part of the Centre of Excellence ECO of the University of Antwerp. You are expected to acquire external funding (national and international).
application deadline September 15, 2008
further information

For the new Department “X-ray Metrology with Synchrotron Radiation“, whose work will mainly be performed on beam tubes of PTB’s own at the Electron Storage Ring BESSY II in Berlin-Adlershof, Division 7 “Temperature and Synchrotron Radiation“ is looking for a graduate physicist with a doctor’s degree and with experience in the application of synchrotron radiation to fill the post of the Head of Department.

The tasks of the department concentrate on the X-ray field and comprise at present X-ray radiometry with calculable radiation and absolute receivers, characterization of detectors and optics, multilayer-, nanolayer- and nanoparticle characterization as well as X-ray spectrometry and surface analysis.

application deadline: August 31, 2008

further information

PANAlytical searchs for a dynamic and internationally oriented regional Application Specialists X-ray Fluorescence for the EMEA region (Europe, Middle East and Africa), who supports PANalytical’s sales organizations in EMEA with application, technical and XRF product knowledge in order to optimize the sales chances.
further information