The ALTECH 2014 conference – Analytical Techniques for Precise Characterization of Nanomaterials – is taking place as symposium H at the E-MRS spring meeting in Lille, France, from May 26-30, 2014. In line with previous ALTECH symposia the 2014 topics address various techniques for the reliable analysis of nano-scaled materials including X-ray spectrometry.

You’ll find the program of ALTECH 2014 following this link.

The E-MRS spring meeting deadline for the abstract submission of your contributions to ALTECH 2014 was January 16, 2014.

• ALTECH2014_flyer
• ALTECH2014_homepage

Tags: EMRP

This entry was posted on Wednesday, March 12th, 2014 at 4:00 pm and is filed under events.