PTB is looking for a doctoral candidate specializing in physics, applied mathematics or relevant engineering science. Grazing incidence or grazing exit X-ray fluorescence (GIXRF / GEXRF) is used at PTB to characterize different nanostructures, from simple layers to three-dimensional structures. PTB's measurement setups enable dimensional characterization and traceable quantification of the different elements present in a sample. These measuring principles are to be further developed, especially for state-of-the-art applications in the semiconductor industry. The open position focusses on the Characterization of nanomaterials with the help of X-ray spectrometry under grazing incidence or grazing detection.
You will find further information here. The application deadline is November 24th, 2019.
This entry was posted on Saturday, November 2nd, 2019 a 05:18 pm.