position for X-ray Spectrometry researcher on semiconductor materials at CEA-Leti in Grenoble
Two subsequent Researcher Excellence Grants (REG) are to be assigned.
1. The REG-Researcher is required to develop and validate measurement protocols, fitting algorithms and modelling strategies for the evaluation of X-Ray Spectrometry (XRS: GI-XRF, XRR, NEXAFS) techniques for the non-destructive characterisation of nanolayers and buried interfaces. The REG-applicant will investigate the performances and limitations of chemical depth-profiling of nanolayers based on both XRS techniques and Angle-resolved XPS technique. This work complements JRP-NEW01 TReND, which includes the management of state-of-the art samples along with the development of GI-XRS-based chemical depth profiling of nanolayers with trace level sensitivity and high information at depths up to 200 nm.
EXPERIENCE REQUIREMENTS: The REG-Researcher must have relevant research experience in X-ray spectrometry and material Science. Experience with synchrotron-based experiments along with experience with programming for the mathematical modelling of experimental data would be advantageous.
DURATION: 12 months
further information
2. The REG-Researcher is required to develop measurement protocols and modelling strategies for the evaluation of Grazing-incidence X-Ray Spectrometry (GI-XRS) techniques for the non-destructive characterisation of nanolayers and buried interfaces. This work is described in JRP NEW01 TReND, which details the management of state-of-the art samples along with the development of GI-XRS-based chemical depth-profiling of nanolayers with trace level sensitivity and high information at depths up to 200 nm.
EXPERIENCE REQUIREMENTS: The REG-Researcher must have relevant research experience in X-ray spectrometry and materials science. Experience with programming for mathematical modelling of experimental data would be advantageous.
DURATION: 18 months
further information
APPLICATION DEADLINE: May 3, 2012 (online subm. until midnight)
CONTACT: Narciso Gambacorti, narciso.gambacorti@cea.fr, +33 (0)4 38 78 05 18
see also NEW TECHNOLOGIES ADVERTS
CEA-LETI in Grenoble is one of the major European research centers for applied electronics with a staff of 1,600 people. More than 85% of its activity is dedicated to research finalized with external partners. CEA-LETI has sparked the creation of nearly thirty high technology start-ups, including Soitec, world leader in silicon on insulator. Leti files some 180 patents a year and manage a portfolio of 1,000 inventions protected by patents. The nanocharacterization platform is composed of several competence centres of physical and chemical characterization techniques including ion beam analysis, x-ray analysis, electron microscopy, scanning probe microscopy, surface analysis and optical characterization techniques together with the mandatory sample preparation. The synergy between all these complementary characterization techniques, the proximity with the ESRF and with the ILL are the key factors that allows the nanocharacterization platform to provide “state-of-the-art” characterization support.
Tags: EMRP