TechnArt2009 homepage

Dear friends and colleagues,
We are pleased to announce that TECHNART 2009 (Non-destructive and Microanalytical Techniques in Art and Cultural Heritage Research) will take place in Athens, Greece from 27 to 30 April 2009. The conference follows the successful organization of TECHNART 2007 in Lisbon, in April 2007 by Prof. Maria Luísa de Carvalho.
The aim of TECHNART 2009 is to provide a scientific forum to present and promote the use of analytical spectroscopy techniques on the field of Cultural Heritage. The conference offers an outstanding and unique opportunity for exchanging knowledge on leading edge developments. Cultural Heritage studies are interpreted in a broad sense, including pigments, stones, metals, glass, ceramics, chemometrics on artwork studies, resins, fibers, forensic applications in art and archaeology, conservation etc.

TECHNART 2009 is organized by the Institute of Nuclear Physics at NCSR “Demokritos”, Athens and the Institute of Electronic Structure and Lasers at FORTH, Heraklion, Crete (IESL-FORTH).

Analytical and Bionalytical Chemistry (ABC) will dedicate a special issue to TECHNART 2009. Selected papers will be published following the normal peer-review process of the journal.

Conference Topics:

X-ray Microanalysis (XRF, XRD, SEM-EDX)
Confocal X-ray Microscopy (3D Micro-XRF, 3D Micro-PIXE)
Synchrotron, Ion Beam and Neutron based techniques/ instrumentation

FT-IR and Raman microscopy
UV-Vis and NIR absorption/ reflectance and fluorescence
Laser-based analytical techniques

Magnetic resonance techniques
Chromatography & Mass spectrometry (GC, HPLC)

Optical imaging & coherence techniques
Mobile spectrometry & remote sensing

1st Announcement and Registration Form due on December 20, 2008

The conference co-chairs
Andreas Karydas (INP, NCSR “Demokritos”, Athens, Greece)
Demetrios Anglos (IESL-FORTH, Heraklion, Greece)

EXSA supports technart 2009

Friday, October 10, 2008 a workshop at the Max-Born-Institute will explain the concept of the prospective Berlin Laboratory for innovative X-Ray Technologies (BLiX).

The workshop dedicated to the fundamental parameters will be held on October 23 -24 , 2008 at the LNE in Paris.

The specific agenda will be drawn up in the next future, subject to the interests and proposals of the participants.

The meeting will start on Thursday afternoon. In the evening, a dinner in a restaurant will be organised.
The meeting will be hosted by the French Laboratoire National de Métrologie et d’Essais (LNE). There will be no charge to attend the meeting but the costs for all travel and meals will be borne by the participants.

French Laboratoire National de Métrologie et d’Essais
further information