EXSA Quantitative Methods in X-Ray Spectrometry

Spring School and Workshop

Information

The book of abstracts is now available in PDF version here

The Spring School get together will take place at Rio Maravilha which is located in LX Factory. Come and join us for a drink at one of the nicest rooftop bars in Lisbon.

The Spring School lectures will take place at rooms 213 and 108 of the Physics Department of the Faculdade de Ciências e Tecnologia of Universidade Nova de Lisboa, and the Workshop will take place at the Uninova lecture hall. Please see the attached map of the campus.

Scientific Scope

This workshop and Spring school is organized by the European X-Ray Spectrometry Association (EXSA) and the Department of Physics of the University NOVA of Lisbon. EXSA was founded to promote innovation and cooperation of X-ray spectroscopists and analysts within Europe by improving the interface between the academic and industrial sector as well as by supporting innovation and cooperation with the manufacturers of X-ray devices. Furthermore, the active community of EXSA supports the further development of methods and applications in the field of X-ray spectrometry also by promoting X-ray spectrometry courses in European university curricula and by providing high quality training in X-ray related techniques for young scientists as well as to find financial support to enhance the participation of talented young scientists in European events such as the European X-Ray Spectrometry (EXRS) conference.

This joint event consists of a two and a half day school on quantification in X-ray spectrometry followed by a two-day workshop on this topic, and of the meeting of the FP initiative www.exsa.hu/fpi.php .

The school is aimed at helping the attendants developing their skills with XRF quantification, to give them tools to understand the calibration procedures, discuss limits of detection and quantification, and provide practical knowledge on the different approaches, methods, and algorithms developed towards quantification for a given system. Experts in the field will give lectures on the fundamentals of X-ray Fluorescence Analysis, will introduce the problems of quantitative XRF determination and will provide deep insights into the quantification methods and tools. Practical sessions on the available approaches and software will follow these theoretical aspects.

The course is designed specifically for Ph.D. students and Postdocs with an understanding of XRF, although undergraduate students that are interested in engaging in this field are not excluded. Attendants are expected to bring their own PC to allow for practical tutorials. An expert talk and a poster session (Wednesday evening) in the following workshop will be organized within the scope of this quantification school to foster the interactions between the participants. It will, therefore, provide an interdisciplinary forum for young scientists working in the field of X-ray Fluorescence Spectrometry to discuss and exchange problems and ideas on the challenges and progress of XRF quantification analysis.

The Workshop targets scientists from academia and industry facing challenges in quantification in X-ray spectrometry. Besides the presentation of experts, the workshop will provide a platform for discussions between the participants.

Recognized experts will give lectures and Hands-on trainings in the following topics:

School Topics

Quantification procedures in XRF

  • Quantification for GI/GEXRF
  • Monte-Carlo methods for quantification
  • Elemental abundances of astrophysical objects from X-ray spectra
  • Combined PIXE and RBS method for quantification of stratified samples
  • Performance and challenges of the detection chain in XRF
  • Quantitative methods and statistical analysis of spectral data with ROOT

Workshop Topics

  • Quantitative high-resolution and μ-XRF (2D and 3D)
  • Quantitative GI/GE XRF and TXRF
  • Quantitative X-ray absorption spectroscopy (XANES, XAFS, EXAFS)
  • Quantification with Monte Carlo methods
  • Quantification with the Fundamental Parameter approach
  • Fundamental Parameters - measurements and calculations