{"id":56127,"date":"2006-10-20T17:17:19","date_gmt":"2006-10-20T15:17:19","guid":{"rendered":"http:\/\/www.exsa.hu\/news\/?page_id=56127"},"modified":"2014-04-24T11:34:28","modified_gmt":"2014-04-24T09:34:28","slug":"institutional-members","status":"publish","type":"page","link":"https:\/\/www.exsa.hu\/news\/?page_id=56127","title":{"rendered":"institutional members"},"content":{"rendered":"<div class=\"row\" style=\"padding-bottom:18px\">\n<div class=\"span4\"><a href=\"..\/?inh=122&amp;im=6\" target=\"_blank\">KETEK GmbH, Munich, Germany<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=XL&amp;url=http:\/\/www.ketek.net\" alt=\"\" \/><\/a><\/div>\n<div class=\"span4\"><a href=\"..\/?inh=122&amp;im=13\" target=\"_blank\">MOXTEK Incorporated<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=XL&amp;url=http:\/\/www.moxtek.com\/\" alt=\"\" \/><\/a><\/div>\n<div class=\"span4\"><a href=\"..\/?inh=122&amp;im=4\" target=\"_blank\">PANalytical<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=XL&amp;url=http:\/\/www.panalytical.com\" alt=\"\" \/><\/a><\/div>\n<\/div>\n<div class=\"row\" style=\"padding-bottom:18px\">\n<div class=\"span4\"><a href=\"..\/?inh=122&amp;im=11\" target=\"_blank\">PNDetector GmbH<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=XL&amp;url=http:\/\/www.pndetector.de\" alt=\"\" \/><\/a><\/div>\n<div class=\"span4\"><a href=\"..\/?inh=122&amp;im=10\" target=\"_blank\">Rigaku Corporation<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=XL&amp;url=http:\/\/www.rigaku.com\/products\/xrf\" alt=\"\" \/><\/a><\/div>\n<div class=\"span4\"><a href=\"..\/?inh=122&amp;im=5\" target=\"_blank\">X-Ray Spectrometry &#8211; an international journal<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=XL&amp;url=http:\/\/www.interscience.wiley.com\/journal\/xrs\" alt=\"\" \/><\/a><\/div>\n<\/div>\n<div class=\"row\" style=\"padding-bottom:18px\">\n<div class=\"span3\"><a href=\"..\/?inh=122&amp;im=7\" target=\"_blank\">Amptek Inc., Bedford, MA, U.S.A.<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=S&amp;url=http:\/\/www.amptek.com\/\" alt=\"\" \/><\/a><\/div>\n<div class=\"span3\"><a href=\"..\/?inh=122&amp;im=9\" target=\"_blank\">Bruker AXS<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=S&amp;url=http:\/\/www.bruker-axs.com\" alt=\"\" \/><\/a><\/div>\n<div class=\"span3\"><a href=\"..\/?inh=122&amp;im=1\" target=\"_blank\">IfG -Institute for Scientific Instruments GmbH<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=S&amp;url=http:\/\/www.ifg-adlershof.de\/\" alt=\"\" \/><\/a><\/div>\n<div class=\"span3\"><a href=\"..\/?inh=122&amp;im=2\" target=\"_blank\">MiTAC, Micro and Trace Analysis Center, University of Antwerp, Belgium<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=S&amp;url=http:\/\/webh01.ua.ac.be\/mitac1\/\" alt=\"\" \/><\/a><\/div>\n<\/div>\n<div class=\"row\">\n<div class=\"span3\"><a href=\"..\/?inh=122&amp;im=12\" target=\"_blank\">PNSensor GmbH<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=S&amp;url=http:\/\/www.pnsensor.de\" alt=\"\" \/><\/a><\/div>\n<div class=\"span3\"><a href=\"..\/?inh=122&amp;im=8\" target=\"_blank\">SII NanoTechnology USA Inc.<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=S&amp;url=http:\/\/www.siintusa.com\/\" alt=\"\" \/><\/a><\/div>\n<div class=\"span3\"><a href=\"..\/?inh=122&amp;im=3\" target=\"_blank\">SPECTRO Analytical Instruments GmbH &amp; Co. KG<br \/>\n<img src=\"http:\/\/image.thumber.de\/?size=S&amp;url=http:\/\/www.spectro.com\" alt=\"\" \/><\/a><\/div>\n<div class=\"span3\"><\/div>\n<\/div>\n<div style=\"text-align: right;\"><a title=\"Thumbshots by Thumber.de\" href=\"http:\/\/thumber.de\" target=\"_blank\"><img loading=\"lazy\" src=\"http:\/\/thumber.de\/img\/88x31button.png\" alt=\"\" width=\"88\" height=\"31\" border=\"0\" \/><\/a><\/div>\n","protected":false},"excerpt":{"rendered":"<p>KETEK GmbH, Munich, Germany MOXTEK Incorporated PANalytical PNDetector GmbH Rigaku Corporation X-Ray Spectrometry &#8211; an international journal Amptek Inc., Bedford, MA, U.S.A. Bruker AXS IfG -Institute for Scientific Instruments GmbH MiTAC, Micro and Trace Analysis Center, University of Antwerp, Belgium PNSensor GmbH SII NanoTechnology USA Inc. SPECTRO Analytical Instruments GmbH &amp; Co. KG<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":500,"menu_order":0,"comment_status":"open","ping_status":"open","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=\/wp\/v2\/pages\/56127"}],"collection":[{"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=56127"}],"version-history":[{"count":8,"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=\/wp\/v2\/pages\/56127\/revisions"}],"predecessor-version":[{"id":137097,"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=\/wp\/v2\/pages\/56127\/revisions\/137097"}],"up":[{"embeddable":true,"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=\/wp\/v2\/pages\/500"}],"wp:attachment":[{"href":"https:\/\/www.exsa.hu\/news\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=56127"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}