As you might know, the International Initiative on X-Ray Fundamental Parameters is actively engaged in publishing a special issue (SI) in Radiation Physics and Chemistry, showcasing the works being performed within the X-ray-matter interaction fundamental parameters.
The goal of this SI is twofold: first, to reflect the multiple interactions and synergy between research groups, metrology institutes and companies on a global level; secondly, to be used as a visit card for gathering new members for the initiative that can expand or improve its outreach with respect to economic, environmental, scientific and societal challenges.
The scope of this SI spans a very wide range of fields, from atomic and molecular physics, nuclear physics, solid state physics, plasma physics and astrophysics as well as other more applied fields.
Works on precision measurements using X-ray technologies, novel detection systems, quantification procedures, theoretical calculations of X-ray absorption or emission, both fundamental and applied, are very welcome.
We hope that you consider submitting your work to this special issue, as it will be seen by the community as an indication of the achievements and vitality of this initiative and its interaction with the global stakeholders.
The submission can be uploaded here until 30/11/2021 by choosing the “VSI:X-Ray Atomic Parameters” regular article or review types.
With our best regards,
Mauro Guerra, Burkhard Beckhoff, Marie-Christine Lépy, and José Paulo Santos
This entry was posted on Thursday, July 29th, 2021 a 05:37 pm.